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A&A Supplement series, Vol. 128, March I 1998, 397-407

Received April 22; accepted July 10, 1997

Structure detection in low intensity X-ray images

J.-L. Starck and M. Pierre

CEA, DSM/DAPNIA, SAP, CEA-Saclay, F-91191 Gif-sur-Yvette Cedex, France


In the context of assessing and characterizing structures in X-ray images, we compare different approaches. Most often the intensity level is very low and necessitates a special treatment of Poisson statistics. The method based on wavelet function histogram is shown to be the most reliable one. We also present a multi-resolution filtering method based on the wavelet coefficients detection. Comparative results are presented by means of a simulated cluster of galaxies.

keywords: X-rays: general -- methods: data analysis -- methods: statistical -- techniques: image processing

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