A&A Supplement series, Vol. 128, March I 1998, 397-407
Received April 22; accepted July 10, 1997
J.-L. Starck and M. PierreCEA, DSM/DAPNIA, SAP, CEA-Saclay, F-91191 Gif-sur-Yvette Cedex, France
In the context of assessing and characterizing structures in X-ray images, we compare different approaches. Most often the intensity level is very low and necessitates a special treatment of Poisson statistics. The method based on wavelet function histogram is shown to be the most reliable one. We also present a multi-resolution filtering method based on the wavelet coefficients detection. Comparative results are presented by means of a simulated cluster of galaxies.
keywords: X-rays: general -- methods: data analysis -- methods: statistical -- techniques: image processing