We carried out laboratory tests with off-the-shelves integrated optics
components designed for micro-sensor applications. The waveguides are made
by ion exchange (here potassium or silver) on a standard glass substrate
thanks to photolithography techniques [Schanen-Duport et al. (1996)]. The exchanged
area is analogous to the core of an optical fiber and the glass substrate
to the fiber cladding. Our component is
schematically depicted in the right part of Fig. 1. We
use it as a two-way beam combiner with two photometric calibration signals.
The component operates in the H atmospheric band (1.43
-
1.77
) and its waveguides are single-mode in that domain. From an
optical point of view, the reverse Y-junction acts as one of the two
outputs of a classical beam splitter. The second part of the
interferometric signal with a
phase shift is radiated at large scale
in the substrate. Light is carried to the component thanks to standard
non-birefringent silica fibers.
We have set up a laboratory Mach-Zehnder interferometer to test the
interferometric capabilities of our components (see the left part of Fig.
1). The available sources are: a 1.54-He-Ne
laser, a 1.55-
laser diode and an halogen white-light source. The
latter is used with an astronomical H filter.
We scan the interferograms by modulating the optical path difference (OPD)
with four points per fringe. The delay line speed is restricted by the
integration time (1 ms for laser sources and
10 ms for the
white-light source to get a sufficient signal-to-noise ratio) and the frame
rate (50 ms of read-out time for the full frame). The OPD scan and the data
acquisition are not synchronized, but for each image the translating stage
provides a position with an accuracy of 0.3
. The simultaneous
recording of the photometric and interferometric signals allows to unbias
the fringe contrast from the photometric fluctuations as suggested by
[Connes et al. (1984)] and validated by [Coudé du Foresto (1994)].
A typical white light interferogram I0 is plotted in
Fig. 2a together with the simultaneous photometric signals
P1 and P2. To correct the raw interferogram from the photometric
fluctuations, we substract a linear combination of P1 and P2 from
I0. The expression of the corrected interferogram is then
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