Astron. Astrophys. Suppl. Ser. 135, 133-144

First DENIS I-band extragalactic catalog

I. Vauglin¹ - G. Paturel¹ - J. Borsenberger² - P. Fouqué^3,4 - N. Epchtein^3,5 - S. Kimeswenger⁶ - D. Tiphène³ - P. Lanoix¹ - H. Courtois¹

Send offprint request: G. Paturel

1 - CRAL-Observatoire de Lyon, F-69561 Saint-Genis Laval Cedex, France
2 - Institut d'Astrophysique de Paris, 98 bis boulevard Arago, F-75014 Paris, France
3 - Observatoire de Paris-Meudon, F-92195 Meudon Principal Cedex, France
4 - European Southern Observatory, La Silla, La Serena, Chile
5 - Observatoire de Nice, Departement Fresnel, BP. 4429, F-06304 Nice Cedex, France
6 - Institut fur Astronomie, Technikerstrasse 25, A-6020 Innsbruck, Austria

Received August 7; accepted October 9, 1998

Abstract:

This paper presents the first I-band photometric catalog of the brightest galaxies extracted from the Deep Near Infrared Survey of the Southern Sky (DENIS) An automatic galaxy recognition program has been developed to build this provisional catalog. The method is based on a discriminating analysis. The most discriminant parameter to separate galaxies from stars is proved to be the peak intensity of an object divided by its array. Its efficiency is better than 99%. The nominal accuracy for galaxy coordinates calculated with the Guide Star Catalog is about 6 arcsec. The cross-identification with galaxies available in the Lyon-Meudon Extragalactic DAtabase (LEDA) allows a calibraton of the I-band photometry with the sample of Mathewson et Al. Thus, the catalog contains total I-band magnitude, isophotal diameter, axis ratio, position angle and a rough estimate of the morphological type code for 20260 galaxies. The internal completeness of this catalog reaches magnitude $I_{\rm lim}=14.5$, with a photometric accuracy of $\sim 0.18$ m. 25% of the Southern sky has been processed in this study.

This quick look analysis allows us to start a radio and spectrographic follow-up long before the end of the survey.

Key words: galaxies: general -- catalogs -- galaxies: photometry -- surveys