From the EUV observations is well known, that solar atmosphere has significant emission measure in the temperature range, intermediate between coronal-chromospheric values. It should lead to significant contribution to microwave emission, contrary to observations (see Zirin et al. [1991] for review).

As was proposed by Grebinskij ([1987]), this dilemma may be solved,
ifone takes into account the spatial inhomogeneity of atmosphere. Following
that paper, we clarify this conclusion with simple scaling laws for model
example of isothermal plasma volume with some electron temperature
= const, and some fixed value of emission measure
= const. We show, that observed microwave *f*-*f* emission
brightness
of such plasma is strongly dependent on
spatial inhomogeneity and becomes negligible for strong
inhomogeneity.

We compare two spatial configurations, in the same projected area,
say
,
with depth .
At homogeneous case, with
,
we have for total emission measure
.
As the model inhomogeneity, we assume
*en ensemble* of some number *K* of horizontal slabs with dimensions
and constant number density
inside and zero outside each slab, with the same
,
and total projected area
.
From the EM balance, one would have

(B1) |

where is a surface filling factor. Now, we consider the normalized optical depth cm) along the line of sight for both configurations, as

(B2) |

and, taking into account Eq. (B1), we find a scaling law for optical depth

(B3) |

Here it is crucial, that we have only one slab at the line of sight, if condition fulfilled (from contrary: if total surface , then slabs

(B4) |

(B5) |

which are correct for condition and becomes same at .

Equations (B1)-(B5) reveal a scaling nature of brightness depression, irrespective of detailed spacing of microscale structures: if the filling factor is sufficiently small (i.e. , and ), then at some wave band we have: . At the shorter wave band with , the emission is optically thin and does not depend on inhomogeneity, but remains reduced as .

These scalings, together with the observed small EUV-filling factors , solves the problem of consistency results of optical and microwave observations: at EUV band we have optically thin emission, proportional to emission measure, but we never detect it at microwaves, with depressed brightness at the optically-thick regime (with , but >>1 at the cm waveband).

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