Up: The beam pattern of
Subsections
We analyze multi-wavelength beam profiles of the 30-m telescope obtained from
Moon limb scans, and demonstrate that the antenna tolerance theory of several
error distributions explained above gives consistent results for the beam
structure and the efficiencies.
We applied the method of total power Moon limb scans to
derive the beam at 3.4 mm, 2 mm, 1.3 mm, and 0.86 mm wavelength, using
SIS receivers of 500 MHz bandwith and similar Gaussian illumination of dB edge taper. The scans of 3600'' length, across the Moon of diameter, allow an investigation of the beam to a distance of
900'' from the beam axis. After focusing the telescope,
the data of a scan were taken on-the-fly in 120 s at a spatial
resolution of 6'' (200 ms sampling rate). Linear baselines, determined at
the outermost , were subtracted from the scans. The
observations were made under very stable atmospheric conditions so that the
measurements are reliable to a level of approximately -30 dB, i.e.
% of the peak intensity. The measurements were made at intermediate elevations where
the homology deformations of the reflector are small (Greve et al. 1998).
For the analysis we have taken scans around New Moon (mostly day time)
and Full Moon (night time) which provide for the analysis the advantage
of a simple brightness distribution of the Moon (Sect. 3.2, Appendix), and
also the possibility to investigate the day and night time performance of
the telescope.
Figure 2 shows a 3.4 mm and a 0.86 mm total power scan across the
Moon, taken around New Moon. The distortion of the intrinsically sharp limb
is due to the finite beam of the telescope.
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Figure 2:
Total power scans across the Moon. The 3.4 mm observation
(thick line) was made 0.5 days after New Moon (6 Sep. 1994); the 0.86 mm
observation (thin line) was made 4 days before New Moon (5 Mar.
1997). Note the decrease in sharpness of the limb with decreasing
wavelength. (The structure of the 3.4 mm scan shows features of the Moon's
surface) |
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Figure 3:
Composite profiles [] (i.e. scans across the
left and right limb of the Moon and differentiated along the scan direction)
observed around New Moon. For each wavelength we show two measurements
(solid dots, open circles) and error bars to demonstrate the repeatability of
the observations. The solid lines show the synthetic best-fit profiles
[], extrapolated somewhat beyond the measurements. The
observations at 3.4 mm, 2 mm, and 1.3 mm are made simultaneously; at 0.86 mm
wavelength only observations 4 days before New Moon are available. (The data
refer to the situation before July 1997) |
Within the limitations of the antenna tolerance theory, the beam pattern
(Eq. (16)) is circular symmetric so that any scan direction across the Moon,
around New Moon and Full Moon, may be used to derive the beam parameters. For
this we use an empirical approach and compare observed scans across the limb
[, differentiated in scan direction called ]with synthetic scans [, differentiated in scan direction
called ]. The synthetic scans are calculated from the
convolution of the beam () (Eq. (16)) and the brightness distribution of the Moon.
For measurements around New Moon and Full Moon we use the symmetric
brightness distribution = T0 with T0 the
average brightness and
| |
(17) |
for (15')2, and zero outside. For New Moon
we use , for Full Moon we use = 0.5 (see
Fig. 10a below). With u measured near culmination approximately
in East-West direction through the center of the Moon, and v
perpendicular to this direction, a synthetic total power scan is
| |
(18) |
In a similar way as applied to the observed profiles , the
synthetic composite profiles
| |
(19) |
are constructed from sections with the left and right wing of
the profile taken outside (15' ) the right and left
limb of the Moon. For observations around New Moon and Full Moon, the sections
of the left ( East) and right ( West) wing are
symmetric and may be added to obtain a composite profile (see
Figs. 10b,c below). Figure 3 shows for New Moon the
observed and the best-fit synthetic profiles, and , respectively; Fig. 4 shows a similar profile at 2 mm
wavelength observed at Full Moon. We emphasize that the
differentiation (Eq. (19)) is not a deconvolution so that the
profiles and shown in
Fig. 3 and Fig. 4 do not exactly represent
the true beam pattern of the telescope.
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Figure 4:
Composite profiles derived from observations at 2
mm wavelength at Full Moon (dots) and New Moon (open circles, see
Fig. 3). The heavy line and the thin line show the best-fit
synthetic profile for Full Moon (night time) and New Moon
(day time), respectively. The additional degradation during day time (New
Moon) is a partially transient effect and is in many cases smaller than
shown here. (The data refer to the situation before July 1997) |
We determined the best-fit beam pattern (u,v) (Eq. (16)) in an
empirical way by minimizing the difference of the observed and synthetic profiles, using
the measured main beam widths and measured main beam
efficiencies , the calculated diffraction pattern
(Sect. 5), the anticipated correlation lengths and
corresponding error beams , and also the fact that the beam
structure should scale with wavelength. Figure 3 and
Fig. 4 show the best-fit synthetic profiles ; the
corresponding beam parameters are shown in Fig. 5.
A consistent interpretation of the measurements shown in Fig. 3
(Fig. 4) is obtained for a beam which consists of the
diffracted beam and at least two persistent error beams
(EB) with correlation lengths 0.3 (+0.2-0.1) m and
1.5 (+0.5-0.1) m. These correlation lengths are identified with
the anticipated panel surface errors () and the panel frame
adjustment errors (), respectively. In addition, there exists a
partially transient degradation close to the main beam which may be
interpreted as an error beam (1st EB) due to large-scale deformations with
correlation length 3 (+1-0.5) m. This transient degradation is
probably due to known transient residual thermal deformations of the reflector
surface and the telescope structure (Greve et al. 1993, 1994b). When present, the
transient thermal deformations are especially noticed during day time and
sunshine (for instance as focus changes) and the comparison of measurements
around New Moon and Full Moon illustrates this effect (see Fig. 4).
From the correlation lengths mentioned above and the measured ratios
(0)/(0) [Eq. (16), Eq. (11)] we
derive, for the time before July 1997, the rms-values
(1st EB) 0.03 - 0.06 mm (see the
footnote of Table 1), (2nd EB) 0.07 mm, and (3rd EB) 0.055 mm. The
illumination weighted rms-value =
R 0.8 (0.095 - 0.11) (0.075 -
0.085) mm derived in this way is consistent with the holography
measurements (D. Morris, priv. comm.) and the efficiency measurements of the
planets (Kramer 1997), as it should be the case.
Table 1:
Beam parameters of the IRAM 30-m telescope (after
July 1997)
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Figure 5 shows the widths and amplitudes of the error beams as derived from the measurements and calculated from
Eqs. (11, 12) for 0 = 0.62 (Greve et al. 1994c) and the
correlation lengths L i and rms-values i determined
above. This figure confirms the wavelength-scaling of the error beams.
When present, the wavelength-scaling of the 1st error beam indicates
that the associated large-scale deformations behave like random
deformations with correlation length = 2.5 - 3.5 m,
of which there are approximately ()2 50
elements covering the aperture. This large number of deformation patches
allows the application of statistical calculations (Greve 1980).
|
Figure 5:
Best-fit values (solid dots) of the widths and
amplitudes of the error beams deduced from the observed
profiles of Fig. 3, and their approximations (solid lines)
from Eq. (12) and Eq. (11), respectively. EB denotes the different error
beams. The 1st EB is a partially transient phenomenon; the data (open
circles) are shown for New Moon day time measurements. The heavy lines
are the current parameters of the beam pattern. The dashed line (2nd EB)
and the related measurements (solid dots) refer to the situation before the
adjustment of July 1997 |
The wavefront errors () derived from holography
measurements corrected for defocus and coma (see footnote 8) are interpreted
to be due to surface errors () of the main reflector. This surface
error distribution [] can be used to derive the surface error
correlation function [] and from this, in an independent way,
the correlation length(s) [L]. Holography measurements at 7 mm (43 GHz)
wavelength are regularly made at 43 elevation using the geostationary
satellite ITALSAT (Morris et al. 1996, 1997). At this elevation the
reflector surface is optimized and free of homology deformations (Greve
et al. 1998). We derived the correlation function (Eq. (14)),
shown in Fig. 6, from pixel holography
measurements made Oct. 1993, Mar. 1994, Nov. 1994, and from a pixel holography measurement of 0.24 m (= D/128) spatial resolution
made Sep. 1996 (Morris et al. 1996). When compared with Gaussian
correlation length distributions ] (Eq. (9)), the
empirical correlation functions show clearly the influence of the panel
frame misalignment (2 in Fig. 6b), with correlation length m, and of the large-scale deformations (1 in
Fig. 6b), with correlation length m. The
resolution of the 128 128 pixel holography map with one or two
measurements per correlation cell m is too low to
clearly indicate the Gaussian component of the panel deformations (3
in Fig. 6b). However, the panel surface errors of correlation
length are clearly illustrated in Fig. 1.
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Figure 6:
Correlation functions derived from holography measurements, and
Gaussian correlation length distributions calculated from Eq. (9). a)
Full extent of the empirical correlation functions, for Oct. 1993, Mar.
1994, Nov. 1994: thin lines; for Sep 1996: thick line. b)
Detailed view of the empirical correlation function of Sep. 1996 (histogram)
and the individual Gaussian correlation functions calculated for = 0.3 m: curve 3; = 1.5 m: curve 2; and
= 2.5 m: curve 1. The normalization is made to curve 2
(2nd EB). The lower curve 1 is due to a low night-time rms-value of the
1st EB |
The aperture efficiency of a reflector with several
independent error distributions is (Ruze 1966; Shifrin 1971; Baars 1973)
| |
(20) |
where
| |
(21) |
is the standard Ruze relation and ( L) a correction
taking into account the scale of the surface errors. It is evident from
Eq. (20) that in particular large-scale deformations (large L) contribute
to , increasing the efficiency . When using in Eqs. (20, 21) the measured values ( i,
L i) given in Table 1, and 0 = 0.62, we find
that in the wavelength region from 0.8 mm to 3 mm the quantity does not exceed , which is below the accuracy of the
measurements. The difference between the Ruze relation (L = 0) and
the complete expression Eq. (20) is so small so that the Ruze relation can
be used for evaluation of the 30-m reflector.
Up: The beam pattern of
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