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The ORFEUS II Echelle Spectrometer: Instrument description, performance and data reduction

J. Barnstedt, N. Kappelmann, I. Appenzeller, A. Fromm, M. Gölz, M. Grewing, W. Gringel, C. Haas, W. Hopfensitz, G. Krämer, J. Krautter, A. Lindenberger, H. Mandel and H. Widmann

Astron. Astrophys. Suppl. Ser., 134 3 (1999) 561-567

DOI: https://doi.org/10.1051/aas:1999156

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