We have shown that the FS model is able to describe very accurately the short term transient for most of the pixels of the LW detector of ISOCAM, for uniform illumination. This remarkable agreement indicates that: (1) the Suris-Fouks-Vinokurov team has properly described the physics of such low background IR detectors and (2) influences of spurious phenomena (as electrodes effects) in the detector are very limited.
All ISO detectors (LWS, SWS, PHOT and SW-CAM) are also based on extrinsic semiconductors technology working under low illumination. Ground-based tests and in-flight observations show that the non-linear behavior and the temperature dependence of the response curves of these detectors seem perfectly reproducible, as for ISOCAM (same illumination history give the same measurements). Different authors (Suris & Fouks 1980; Fouks 1981a; Fouks 1981b; Vinokurov & Fouks 1991; Fouks 1992) have solved the solid state equations for different kinds of extrinsic detectors. One of the strongest hypothesis is the bulk thickness, since with a thin thickness, a hook behavior is predicted.
Variations of the temperature of the detectors could also affect the
response curves.
For LW-ISOCAM, these variations are always lower than 1%
around the mean value (close to 3 K).
For ISOPHOT-S1, variations could be of 
10%
(Schubert 1995) and must be taken into account (Fouks & Schubert 1995).
The transient behavior of other detectors on ISO should also be described by this kind of model. Therefore a transient correction should also be possible without any fitting or parameters adjustments. It should allow a significant increase of the final accuracy of processed data.
The current main limitation of these models is they are one dimensional: the pixel surface must be uniformly illuminated and no gradient must exist between neighborhood pixels.
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